Probing materials one atom at a time with low-voltage scanning transmission electron microscopy

Ramasse, Q. M.1, Kepaptsoglou, D. M.1, Seabourne, C. R.2
1SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury WA4 4AD, U. K.
2Institute for Materials Research, SPEME, University of Leeds, U.K.
Keywords: STEM, EELS, graphene, oxides defects


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