Probing materials one atom at a time with low-voltage scanning transmission electron microscopy
Ramasse, Q. M.
1
,
Kepaptsoglou, D. M.
1
,
Seabourne, C. R.
2
1
SuperSTEM Laboratory, STFC Daresbury Campus, Daresbury WA4 4AD, U. K.
2
Institute for Materials Research, SPEME, University of Leeds, U.K.
Keywords
:
STEM, EELS, graphene, oxides defects
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-1-7
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