Calibration of HRTEM for lattice parameter measurements in nanocrystals
Sáfrán, G.
1
1
Institute for Technical Physics and Materials Science, Research Centre for Natural Sciences, Hungarian Academy of Sciences, Thin Films Physics, Budapest, Hungary
Keywords
:
HRTEM calibration, reference layer, composition measurement
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-2-2
Preview
PDF
Download (1686Kb)
UNSPECIFIED