MIM.1.P018 New FIB design combines extremely high beam currents with nanometer precision possibilities
Fladischer, K.
,
Schultheiss, K.
,
Kübler, C.
,
Doemer, H.
,
Hill, R.
Subjects
:
Multimodal and Interdisciplinary Microscopies (MIM)
URN
:
urn:nbn:de:bvb:355-mc2013-256-3
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