MIM.3.P040 Low voltage TEM - new tool for nanoparticle characterization

Drsticka, M., Nebesarova, J., Vancova, M., Bily, T., Coufalova, E., Stepan, P.
Subjects: Multimodal and Interdisciplinary Microscopies (MIM)
URN: urn:nbn:de:bvb:355-mc2013-278-5

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