LBP.MIM.P07 Simultaneos detection of scattering angles for Scanning Transmission Electron Microscopy using a segmented diode-detector with dedicated High-Angled Annual Dark-Field view
Aliman, M.
,
Arnold, R.
,
Berger, W.
,
Meyer, S.
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-29-1
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