MIM.7.P112 A new level-dependent noise reduction method applied to high resolution SEM images

Kockentiedt, S., Gernert, U.
Keywords: scanning electron microscopy, SEM, noise reduction, noise estimation, Poisson noise, shot noise
Subjects: Multimodal and Interdisciplinary Microscopies (MIM)
URN: urn:nbn:de:bvb:355-mc2013-352-7

[img]
Preview

PDF
Download (176Kb)
Creative Commons: Attribution 3.0
EPrints Logo
Proceedings MC 2013 is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.