IM.1.001 The influence of detector non-uniformity on STEM imaging
LeBeau, J. M.
,
Findaly, S. D.
Keywords
:
high angle annular dark-field, annular bright field, STEM Current
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-362-2
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