IM.1.004 Strain Analysis by Nano-Beam Electron Diffraction (SANBED): Present performance and future prospects

Müller, K., Ryll, H., Ordavo, I., Zillmann, D., Schowalter, M., Zweck, J., Soltau, H., Ihle, S., Strüder, L., Volz, K., Potapov, P., Rosenauer, A.
Keywords: STEM, CBED, strain, diffraction
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-365-8

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