IM.1.P020 Sample thickness determination by low-energy scanning transmission electron microscopy

Volkenandt, T., Müller, E., Pfaff, M., Gerthsen, D.
Keywords: STEM, low electron energy, thickness determination
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-381-8

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