IM.1.P034 Investigating nanostructure heterojunctions using nanobeam electron diffraction
Persson, J. M.
,
Wagner, J. B.
Keywords
:
TEM, NBED, strain analysis
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-394-5
PDF
Download (192Kb)
Creative Commons: Attribution 3.0