IM.2.P050 New detection methods for fast analysis of nano-particles
Roussel, L.
,
Sluyterman, S.
,
Bosch, E.
,
Gestmann, I.
Keywords
:
nano-particles, detection, SEM
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-410-1
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