IM.3.P067 X-ray microanalysis in the environmental or variable pressure scanning electron microscope
Rattenberger, J.
,
Schroettner, H.
,
Wagner, J.
,
Hofer, F.
Keywords
:
ESEM, EDXS quantification, scattering
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-428-9
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