IM.4.075 Probing materials one atom at a time with low-voltage scanning transmission electron microscopy
Ramasse, Q. M.
,
Kepaptsoglou, D. M.
,
Seabourne, C. R.
,
Zan, R.
,
Schaffer, B.
,
Bangert, U.
,
Scott, A. J.
,
Azough, F.
,
Freer, R..
Keywords
:
STEM, EELS, graphene, oxides defects
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-436-3
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