IM.4.075 Probing materials one atom at a time with low-voltage scanning transmission electron microscopy

Ramasse, Q. M., Kepaptsoglou, D. M., Seabourne, C. R. , Zan, R., Schaffer, B., Bangert, U., Scott, A. J., Azough, F., Freer, R..
Keywords: STEM, EELS, graphene, oxides defects

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