IM.4.079 Optimization of experimental parameters for minimizing the inelastic delocalization in low loss EELS experiments utilizing Low- Voltage EELS

Stöger-Pollach, M.

Keywords: inelastic delocalization, Low-Voltage EELS, optical properties

Subjects: Instrumentation and Methods (IM)

URN: urn:nbn:de:bvb:355-mc2013-440-6

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