IM.4.P083 Density measurement in thin layers by electron energy loss spectroscopy (EELS)
Thomas, J.
,
Gemming, T.
,
Ramm, J.
Keywords
:
EELS, thin layers, density
Subjects
:
Instrumentation and Methods (IM)
URN
:
urn:nbn:de:bvb:355-mc2013-444-8
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