IM.4.P088 Characterization of cubic GaN/AlN multi-quantum wells using stateof- the-art analytical STEM

Lindner, J., Kemper, R. M. , As, D. J., Meertens, D., Kovács, A., Luysberg, M., Tillmann, K.
Keywords: analytical STEM, EELS, EDS
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-449-9

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