IM.4.P095 Next generation of SDD detectors for ultra-fast, high-resolution EDS in microanalysis

Niculae, A., Bornschlegl, M., Eckhardt, R., Herrmann, J., Jeschke, S., Krenz, G., Liebel, A., Lutz, G., Soltau, H., Strüder, L.
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-456-4

[img]
PDF
Download (235Kb)
Creative Commons: Attribution 3.0
EPrints Logo
Proceedings MC 2013 is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.