IM.4.P096 Characterization of nanostructured materials by structural and spectroscopic imaging in Cs-corrected TEM/STEM

Schmid, H., Longo, P., Mader, W.

Keywords: probe corrected STEM, HAADF, ABF, ESI/SIX, ZnO, inversion domain boundary

Subjects: Instrumentation and Methods (IM)

URN: urn:nbn:de:bvb:355-mc2013-457-9

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