IM.4.P100 Influence of inelastic scattering on EFTEM images - exemplified on graphene and silicon at 20kV

Lee, Z., Rose, H., Hambach, R., Wachsmuth, P., Kaiser, U.
Keywords: EFTEM, inelastic scattering, mutual coherence, low voltage, zero-loss, plasmon-loss
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-461-2

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