IM.5.103 Field Mapping by Off-Axis Electron Holography: From Devices to the Detection of single Dopant Atoms

Cooper, D., Rouviere, J.-L., Dunin-Borkowski, R. E.

Keywords: electron holography, dopant potentials, strain mapping, semiconductors, graphene

Subjects: Instrumentation and Methods (IM)

URN: urn:nbn:de:bvb:355-mc2013-464-8

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