IM.5.P115 Focused ion beam specimen preparation for electron holography of electrically biased thin film solar cells

Duchamp, M., den Hertog, M., Imlau, R., Boothroyd, C. B., Kovacs, A., Tavabi, A. H., Dunin- Borkowski, R. E.

Keywords: Electron holography, biased TEM specimen, thin film solar cell, FIB

Subjects: Instrumentation and Methods (IM)

URN: urn:nbn:de:bvb:355-mc2013-476-4

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