IM.6.P133 Resolution Extension in Missing-wedge-free Dark-field Tomography

Tyutyunnikov, D., Koch, C., van Aken, P.
Keywords: transmission, electron, microscopy, tomography, charge-flipping, reconstruction algorithm
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-494-0

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