IM.6.P134 New applications in Atom Probe Tomography

Ehrke, H.-U., Valley, J. W. , Ushikubo, T., Miller, M. K., Takamizawa, H., Shimizu, Y., Gordon, L. M., Joester, D., Giddings, A. D., Larson, D. J.
Keywords: Atom Probe Tomography, nano-scale, spectrometry
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-495-5

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