IM.7.P146 Comparison of TEM lamella preparation techniques on titania nanotube-arrays / metal Ti interface

Gec, M., Krivec, M., Žagar, K., Suhadolnik, L., Jenko, D., Dražić, G., Čeh, M.

Keywords: TEM sample preparation, TiO2 nanotube-array, Ion Slicer, Focused ion beam (FIB)

Subjects: Instrumentation and Methods (IM)

URN: urn:nbn:de:bvb:355-mc2013-507-8

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