MS.2.P031 Aberration-Corrected Microscopy and Spectroscopy of SiAlON Ceramics

Yurdakul, H., Idrobo, J.-C., Okunishi, E., Pennycook, S. J., Turan, S.
Keywords: Cs-corrected STEM, atomic-resolved EELS, SiAlON, Ceramics
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-571-3

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