MS.3.P067 Transmission electron microscopy study of defects in BiFeO3 thin films

Deniz, H., Bhatnagar, A., Pippel, E., Alexe, M., Hesse, D.
Keywords: lattice defects, Aurivillius-type structure, BiFeO3 films
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-607-3

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