MS.5.P125 The Influence of the Electron Beam on Potentiometry of GaN

Park, J. B., Niermann, T., Beleggia, M., Lehmann, M.
Keywords: GaN, p-n Junction, off-axis EH
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-665-4

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