MS.5.P141 Microstructural investigation of magnetic CoCrPt:SiO2 films

Santecchia, E., Barucca, G., Mengucci, P., Varvaro, G., Testa, A. M., Agostinelli, E., Springer, F., Brombacher, C., Albrecht, M.
Keywords: magnetic films, transmission electron microscopy (TEM), X-ray diffraction (XRD)
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-681-3

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