MS.5.P148 Microstructure investigation of porous gallium-nitride thin films

Poppitz, D., Lotnyk, A., Gerlach, J., Rauschenbach, B.
Keywords: Cs-corrected STEM, FIB, GaN
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-688-0

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