MS.5.P153 Characterizing the atomic and electronic structure of the defects in CrN films by advanced TEM

Zhang, Z., Daniel, R., Mitterer, C., Dehm, G.

Keywords: CS-corrected HRTEM, EELS, electron diffraction

Subjects: Materials Science (MS)

URN: urn:nbn:de:bvb:355-mc2013-693-5

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