MS.6.P176 High resolution STEM analysis of Sr and Yb in Al - 5wt.% Si alloys

Albu, M., Li, J., Kothleitner, G., Schumacher, P., Hofer, F.
Keywords: Al-Si alloy, Trace elements, HRSTEM HAADF
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-716-8

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