MS.6.P184 Characterization of closely crystallographically related phases in γ- TiAl alloys by HEXRD and TEM imaging
Gabrisch, H.
,
Mayer, S.
,
Pyczak, F.
,
Rackel, M.
,
Lorenz, U.
,
Schell, N.
,
Schreyer, A.
,
Stark, A.
Keywords
:
gamma-md, orthorhombic distortion, B19 phase
Subjects
:
Materials Science (MS)
URN
:
urn:nbn:de:bvb:355-mc2013-724-3
PDF
Download (344Kb)
Creative Commons: Attribution 3.0