IM.2.P051 Expanding the boundaries of FIB-SEM technology: Developments for best application results

Schulmeyer, I., Kienle, M.

Keywords: FIB, high throughput, high current FIB, Analytics, In-Situ experiments

Subjects: Instrumentation and Methods (IM)

URN: urn:nbn:de:bvb:355-mc2013-411-6

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