IM.4.078 Contribution of thermally scattered electrons to atomic resolution elemental maps

Forbes, B., D'Alfonso, A., Williams, R., Rajagopalan, S., Fraser, H., McComb, D., Freitag, B., Klenov, D., Allen, L.
Keywords: transmission electron microscopy; thermal scattering; energy dispersive x-ray analysis
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-439-4

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