IM.6.P135 Combined SIMS-SPM instrument for high sensitivity and high resolution elemental 3D analysis

Fleming, Y., Wirtz, T., Gérard, M., Philipp, P., Gysin, U., Glatzel, T., Meyer, E., Maier, U., Wegmann, U.
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-496-1

[img]
PDF
Download (127Kb)
Creative Commons: Attribution 3.0
EPrints Logo
Proceedings MC 2013 is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton. More information and software credits.