IM.7.140 Using the X2-Holder to Create Thin TEM-lamella by FIB

van Mierlo, W., Robins, A. C., Kaiser, U.
Keywords: FIB, TEM, Sample preparation
Subjects: Instrumentation and Methods (IM)
URN: urn:nbn:de:bvb:355-mc2013-501-6

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