MS.5.P128 Spontaneous barrier layer formation in SiO2/Cu-Mn alloy film interface

Misják, F., Yamasaki, J., Yamamoto, Y., Lábár, J., Tanaka, N., Radnóczi, G.
Keywords: barrier layer, Cu-Mn films, amorphous alloy, HREM, EELS
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-668-0

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