MS.5.P128 Spontaneous barrier layer formation in SiO2/Cu-Mn alloy film interface
Misják, F.
,
Yamasaki, J.
,
Yamamoto, Y.
,
Lábár, J.
,
Tanaka, N.
,
Radnóczi, G.
Keywords
:
barrier layer, Cu-Mn films, amorphous alloy, HREM, EELS
Subjects
:
Materials Science (MS)
URN
:
urn:nbn:de:bvb:355-mc2013-668-0
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