MS.5.P134 Transmission electron microscopy characterization of the growth and properties of Al-Si-Cu-Fe approximant thin films

Garbrecht, M., Olsson, S., Eriksson, F., Birch, J., Hultman, L.

Keywords: HR(S)TEM, approximants, quasicrystals

Subjects: Materials Science (MS)

URN: urn:nbn:de:bvb:355-mc2013-674-4

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