MS.5.P145 Substrate strain measurements by convergent beam electron diffraction in epitaxially grown Ba(Fe1-xCox)2As2 thin films

Chekhonin, P., Engelmann, J., Gemming, T., Holzapfel, B., Rellinghaus, B., Oertel, C.-G., Skrotzki, W.
Keywords: CBED, strain, thin film, superconductivity
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-685-4

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