MS.5.P152 In-situ inspection of nanogap structures fabrication by electromigration

Bejtka, K., Chiodoni, A., Motto, P., Rattalino, I., Piccinini, G., Demarchi, D., Pirri, C. F.
Keywords: electromigration, EIBJ, nanogap, electron microscopy
Subjects: Materials Science (MS)
URN: urn:nbn:de:bvb:355-mc2013-692-9

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