MS.7.P207 Coupling effects of Ge/Si quantum dots studied by conductive atomic force microscopy and Kelvin probe force microscopy

Ye, F., Zhang, Y., Lv, Y., Yang, X.

Keywords: Coupling effects, GeSi quantum dots, Conductive atomic force microscopy, Kelvin force microscopy

Subjects: Materials Science (MS)

URN: urn:nbn:de:bvb:355-mc2013-747-9

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